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Investigation on Intermittent Life Testing Program for IGBT
Yu Cheng Guicui Fu Maogong Jiang Peng Xue
Vol. 17, No. 3, pp. 811-820, May 2017
10.6113/JPE.2019.17.3.811
Vol. 17, No. 3, pp. 811-820, May 2017
10.6113/JPE.2019.17.3.811
An Excess Carrier Lifetime Extraction Method for Physics-based IGBT Models
ISSN : 1598 - 2092
eISSN : 2093 - 4718